Dynamic measurements at terahertz frequencies with a fast rotary delay line

被引：0
|
作者：
Guerboukha, Hichem [1 ]
Markov, Andrey [1 ]
Qu, Hang [1 ]
Skorobogatiy, Maksim [1 ]
机构：
[1] Ecole Polytech Montreal, Dept Engn Phys, Montreal, PQ, Canada
来源：
2015 PHOTONICS NORTH | 2015年
关键词：
THz; spectroscopy; delay line; instrumentation;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A fast rotary delay line is fabricated and characterized for terahertz (THz) frequencies. With this new device, we present dynamic measurements of spray painting process and fast moving objects detection along with thickness determination.
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页数：1
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