PIXE ANALYSIS OF MULTIELEMENTAL SAMPLES

In this work Proton-Induced X-ray Emission (PIXE) technique has been employed for the determination of major, minor and trace constituents of some multielemental samples (environmental, and metallurgical). PIXE analyses have been carried out using a 3 MeV proton beam generated with the aid of the 7 MV FN tandem accelerator of the "Horia Hulubei" National Institute of Physics and Nuclear Engineering (NIPNE) Bucharest. The X-ray and particle spectra were processed off-line using LEONE and GUPIX software. In the investigated environmental samples (vegetable leaves and soils) PIXE technique allowed determination of: S, Cl, K, Ca, Ti, Cr, Mn, Fe, Ni, Cu, Zn, As, Sr, Se, Br, Hg and Pb. The elements identified in the metallurgical samples (steels) using PIXE were: K, Ca, V, Cr, Mn, Fe, Co, Cu, Ni, Zn, W, Ga, As, Pb, Mo, Rb, In, Rh, Zr, Pd, Nb, Sn and Sb. A comparison of the matrix effects in PIXE analysis of thick and thin targets has been made. PIXE is a sensitive, multielement analytical technique used for the determination of minor and trace elements in a variety of samples, with sensitivities in the range of mg center dot kg(-1).