Spectral and spatial measurements of a laser-produced plasma EUV source for 13.5 nm based on a double stream Xe/He gas puff target

被引:0
作者
Rakowski, R. [1 ]
Bartnik, A. [1 ]
Fiedorowicz, H. [1 ]
Jarocki, R. [1 ]
Kostecki, J. [1 ]
Krzywinski, J.
Mikolajczyk, J. [1 ]
Ryc, L.
Szczurek, M. [1 ]
Wachulak, P. [1 ]
机构
[1] Mil Univ Technol, Inst Optoelect, Warsaw, Poland
来源
LASERS AND APPLICATIONS | 2005年 / 5958卷
关键词
laser-produced plasma EUV source; gas puff target; EUV spectroscopy; pinhole camera;
D O I
10.1117/12.622218
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The results of the spectral and spatial measurements of a laser-produced (LPP) plasma source of extreme ultraviolet (EUV) for 13.5 nm are presented. The double stream Xe/He gas puff target in the source was utilizing. The source was equipped with a Nd: YAG laser system (E = 0.55 J, t = 3.9 ns, f = 10 Hz, M(2) = 2.5) and was dedicated to EUV metrology purposes. An advantage of this approach of the laser-plasma source is a debris free EUV emission. For the spectral research a transmission grating spectrograph (TGS) and a grazing incidence spectrograph (GIS) were utilized. For spatial measurements a pinhole camera was employed. The influence on EUV emission of the laser focal spot position in relation to the gas puff target and the time delays between opening valves and the laser pulse were investigated.
引用
收藏
页数:11
相关论文
共 8 条
[1]   Plasma sources for EUV lithography exposure tools [J].
Banine, V ;
Moors, R .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2004, 37 (23) :3207-3212
[2]   High-resolution spectrum of xenon ions at 13.4 nm [J].
Churilov, S ;
Joshi, YN ;
Reader, J .
OPTICS LETTERS, 2003, 28 (16) :1478-1480
[3]   Absorption of EUV in laser plasmas generated on xenon gas jets [J].
de Bruijn, R ;
Koshelev, K ;
Kooijman, G ;
Toma, ES ;
Bijkerk, F .
JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER, 2003, 81 (1-4) :97-105
[4]  
Eidmann K, 1990, J Xray Sci Technol, V2, P259, DOI 10.3233/XST-1990-2403
[5]   Enhanced X-ray emission in the 1-keV range from a laser-irradiated gas puff target produced using the double-nozzle setup [J].
Fiedorowicz, H ;
Bartnik, A ;
Jarocki, R ;
Rakowski, R ;
Szczurek, M .
APPLIED PHYSICS B-LASERS AND OPTICS, 2000, 70 (02) :305-308
[6]   DEVELOPMENT OF A FLAT-FIELD GRAZING-INCIDENCE XUV SPECTROMETER AND ITS APPLICATION IN PICOSECOND XUV SPECTROSCOPY [J].
NAKANO, N ;
KURODA, H ;
KITA, T ;
HARADA, T .
APPLIED OPTICS, 1984, 23 (14) :2386-2392
[7]  
OSULLIVAN G, 2005, EUV SOURCES EUVL LIT
[8]  
RAKOWSKI R, 2003, P 16 INT S PLASM CHE