Profile measurements of high intensity low energy ion beams

被引:1
作者
Rezzonico, L
Olivo, M
机构
关键词
D O I
10.1063/1.1146687
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A noninterceptive beam profile monitor based on the measurement of the light arising from the collision of the beam with the residual gas is being implemented in the 60 and 870 keV high intensity de-beam lines of the Paul Scherrer Institute accelerator complex. Beam profiles measured with this monitor are compared to those obtained with a calorimeter at 60 keV, and with a wire scanner at 870 keV. Wire scanners are presently used in the 870 keV beam line. Because of heat load limitations in the scanner wires the beam has to be pulsed when profiles are taken. However, because of space charge neutralization effects, the profile of a pulsed beam may differ from that of a de beam. (C) 1996 American Institute of Physics.
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页码:1246 / 1248
页数:3
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