Electron-impact excitation of argon: Optical emission cross sections in the range of 300-2500 nm

被引：71
作者：
Boffard, John B.
Chiaro, B.
Weber, Tobin
Lin, Chun C.
机构：
[1] Univ Wisconsin, Dept Phys, Madison, WI 53706 USA
[2] Univ Calif San Diego, Dept Phys, San Diego, CA 92093 USA
来源：
ATOMIC DATA AND NUCLEAR DATA TABLES | 2007年 / 93卷 / 06期
基金：
美国国家科学基金会;
关键词：
FOURIER-TRANSFORM SPECTROSCOPY; RESONANCE RADIATION; METASTABLE LEVELS; AR-II; STATES; LINES; IMPRISONMENT; ULTRAVIOLET; IONIZATION; COLLISIONS;
D O I：
10.1016/j.adt.2007.06.004
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
We present measurements of optical emission cross sections for excitation from the ground state of the Ar atom into over 185 excited atomic and ionic levels. Measurements were made at electron energies of 25, 50, and 100 eV, at a gas pressure of 5 mTorr. Due to radiation trapping of resonance levels, many of the cross sections depend on the target pressure. Detailed pressure dependence for over 50 levels is also provided. The energy dependence of the excitation cross sections for over 175 levels in the energy range of 0-250 eV are provided as fitted parameters for a standard analytical function. (c) 2007 Elsevier Inc. All rights reserved.
引用
收藏
页码：831 / 863
页数：33
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