A Novel Technique for Determining the Location of a Hermetic Leak in a 'Metal Can' (TO-x) Package

被引:0
作者
Nail, Carl [1 ]
机构
[1] Natl Semicond Corp, Santa Clara, CA USA
来源
ISTFA 2007 | 2007年
关键词
D O I
暂无
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Root-cause analysis of hermetic leak failures is complicated by the difficulty in isolating the leak location. Standard dye penetrant inspection is not consistently successful. The addition of pressure to the dye penetrant, followed by metallographic mounting and preparation, and subsequently followed by vacuum storage, greatly enhances the visibility of the dye and more effectively decorates the leak location.
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页码:231 / 235
页数:5
相关论文
共 2 条
  • [1] BUREAU OF JUSTICE ASSISTANCE U.S. DEP'T OF JUSTICE, 2006, MILSTD883G US DEP DE, P1
  • [2] National Research Council, 1999, M100S9 NCCLS, P1