Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever

被引:265
作者
Rodríguez, TR [1 ]
García, R [1 ]
机构
[1] CSIC, Inst Microelect Madrid, Madrid 28760, Spain
关键词
D O I
10.1063/1.1642273
中图分类号
O59 [应用物理学];
学科分类号
摘要
We propose a method for mapping the composition of a surface by using an amplitude modulation atomic force microscope operated without tip-surface mechanical contact. The method consists in exciting the first two modes of the microcantilever. The nonlinear dynamics of the tip motion, the coupling of its first two modes, and the sensitivity of the second mode to long-range attractive forces allows us to use this mode to probe compositional changes while the signal from the first mode is used to image the sample surface. We demonstrate that the second mode has a sensitivity to surface force variations below 10(-11) N. (C) 2004 American Institute of Physics.
引用
收藏
页码:449 / 451
页数:3
相关论文
共 28 条
[1]  
[Anonymous], 1992, INTERMOLECULAR SURFA
[2]  
[Anonymous], 1981, THEORY ELASTICITY
[3]   Characterization of the morphologies and nanostructures of blends of poly(styrene) block-poly(ethene-co-but-1-ene)-block-poly(styrene) with isotactic and atactic polypropylenes by tapping-mode atomic force microscopy [J].
Bar, G ;
Thomann, Y ;
Whangbo, MH .
LANGMUIR, 1998, 14 (05) :1219-1226
[4]   Phase imaging: Deep or superficial? [J].
Behrend, OP ;
Odoni, L ;
Loubet, JL ;
Burnham, NA .
APPLIED PHYSICS LETTERS, 1999, 75 (17) :2551-2553
[5]   CALCULATION OF THERMAL NOISE IN ATOMIC-FORCE MICROSCOPY [J].
BUTT, HJ ;
JASCHKE, M .
NANOTECHNOLOGY, 1995, 6 (01) :1-7
[6]   Energy dissipation in tapping-mode atomic force microscopy [J].
Cleveland, JP ;
Anczykowski, B ;
Schmid, AE ;
Elings, VB .
APPLIED PHYSICS LETTERS, 1998, 72 (20) :2613-2615
[7]   Eigenfrequencies of a rectangular atomic force microscope cantilever in a medium [J].
Elmer, FJ ;
Dreier, M .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (12) :7709-7714
[8]   Dynamic atomic force microscopy methods [J].
García, R ;
Pérez, R .
SURFACE SCIENCE REPORTS, 2002, 47 (6-8) :197-301
[9]   Phase contrast in tapping-mode scanning force microscopy [J].
Garcia, R ;
Tamayo, J ;
Calleja, M ;
Garcia, F .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1) :S309-S312
[10]   Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy [J].
García, R ;
San Paulo, A .
PHYSICAL REVIEW B, 1999, 60 (07) :4961-4967