Multiple-differential side-channel collision attacks on AES

被引:0
|
作者
Bogdanov, Andrey [1 ]
机构
[1] Ruhr Univ Bochum, Horst Gortz Inst IT Secur, Bochum, Germany
来源
CRYPTOGRAPHIC HARDWARE AND EMBEDDED SYSTEMS - CHES 2008, PROCEEDINGS | 2008年 / 5154卷
关键词
side-channel attacks; collision detection; muiltiple-differential; collision attacks; AES; DPA;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, two efficient multiple-differential methods to detect collisions in the presence of strong noise are proposed - binary and ternary voting. After collisions, have been detected, the cryptographic key can be recovered from these collisions using such recent cryptanalytic techniques as linear [1] and algebraic [2] collision attacks. We refer to this combination of the collision detection methods and cryptanalytic techniques as multiple-differential collision attacks (MDCA). When applied to AES, MDCA using binary voting without profiling requires about 2.7 to 13.2 times less traces than the Hamming-weight based CPA for the same implementation. MDCA oil AES using ternary voting with profiling and linear key recovery clearly outperforms CPA by requiring only about 6 online measurements for the range of noise amplitudes where CPA requires from 163 to 6912 measurements. These over, neither key nor attacks do not need the S-box to be known. Moreover, neither key nor plaintext have to he known to the attacker in the profiling stage.
引用
收藏
页码:30 / 44
页数:15
相关论文
共 50 条
  • [41] AES-based security coprocessor IC in 0.18-μm CMOS with resistance to differential power analysis side-channel attacks
    Hwang, DD
    Tiri, K
    Hodjat, A
    Lai, BC
    Yang, SL
    Schallmont, P
    Verbauwhede, I
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2006, 41 (04) : 781 - 791
  • [42] Practical improvements of side-channel attacks on AES: feedback from the 2nd DPA contest
    Clavier, Christophe
    Danger, Jean-Luc
    Duc, Guillaume
    Elaabid, M. Abdelaziz
    Gerard, Benoit
    Guilley, Sylvain
    Heuser, Annelie
    Kasper, Michael
    Li, Yang
    Lomne, Victor
    Nakatsu, Daisuke
    Ohta, Kazuo
    Sakiyama, Kazuo
    Sauvage, Laurent
    Schindler, Werner
    Stottinger, Marc
    Veyrat-Charvillon, Nicolas
    Walle, Matthieu
    Wurcker, Antoine
    JOURNAL OF CRYPTOGRAPHIC ENGINEERING, 2014, 4 (04) : 259 - 274
  • [43] A Compact AES Hardware Implementation Secure against 1st-Order Side-Channel Attacks
    Zhang, Qian
    Zhou, Yongbin
    Qiu, Shuang
    Cheng, Wei
    Ming, Jingdian
    Zhang, Rui
    2018 IEEE 36TH INTERNATIONAL CONFERENCE ON COMPUTER DESIGN (ICCD), 2018, : 545 - 552
  • [44] Generalizing Statistical Ineffective Fault Attacks in the Spirit of Side-Channel Attacks
    Barbu, Guillaume
    Castelnovi, Laurent
    Chabrier, Thomas
    CONSTRUCTIVE SIDE-CHANNEL ANALYSIS AND SECURE DESIGN, COSADE 2021, 2021, 12910 : 105 - 125
  • [45] MEAS: memory encryption and authentication secure against side-channel attacks
    Unterluggauer, Thomas
    Werner, Mario
    Mangard, Stefan
    JOURNAL OF CRYPTOGRAPHIC ENGINEERING, 2019, 9 (02) : 137 - 158
  • [46] Combining Loop Shuffling and Code PolyMorphism for Enhanced AES Side-Channel Security
    Belleville, Nicolas
    Masure, Loic
    CONSTRUCTIVE SIDE-CHANNEL ANALYSIS AND SECURE DESIGN, COSADE 2024, 2024, 14595 : 260 - 280
  • [47] Side-channel cryptographic attacks using pseudo-boolean optimization
    Oren, Yossef
    Wool, Avishai
    CONSTRAINTS, 2016, 21 (04) : 616 - 645
  • [48] ISA Extensions of Shuffling Against Side-Channel Attacks
    Zhou, Jiayun
    Qin, Guofeng
    Li, Lu
    Guo, Chun
    Wang, Weijia
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2024, 43 (03) : 761 - 773
  • [49] Power Side-Channel Attacks in Negative Capacitance Transistor
    Knechtel, Johann
    Patnaik, Satwik
    Nabeel, Mohammed
    Ashraf, Mohammed
    Chauhan, Yogesh S.
    Henkel, Jorg
    Sinanoglu, Ozgur
    Amrouch, Hussam
    IEEE MICRO, 2020, 40 (06) : 74 - 83
  • [50] Side-Channel Attacks on Triple Modular Redundancy Schemes
    Almeida, Felipe
    Aksoy, Levent
    Raik, Jaan
    Pagliarini, Samuel
    2021 IEEE 30TH ASIAN TEST SYMPOSIUM (ATS 2021), 2021, : 79 - 84