Duplex structure in K0.5Na0.5NbO3-SrZrO3 ceramics with temperature-stable dielectric properties

被引:105
作者
Liu, Zhiyong [1 ]
Fan, Huiqing [1 ]
Lei, Shenhui [1 ]
Ren, Xiaohu [1 ]
Long, Changbai [1 ]
机构
[1] Northwestern Polytech Univ, Sch Mat Sci & Engn, State Key Lab Solidificat Proc, Xian 710072, Peoples R China
关键词
KNN-based; X8R specification; Core-shell structure; TEM; CORE-SHELL STRUCTURE; LEAD-FREE CERAMICS; PIEZOELECTRIC CERAMICS; SYSTEM; BATIO3; MICROSTRUCTURE; PIEZOCERAMICS; NIOBATE;
D O I
10.1016/j.jeurceramsoc.2016.07.024
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Temperature-stable dielectric properties have been developed in the 0.86 K0.5Na0.5NbO3-0.14SrZrO(3) solid solution system. High dielectric permittivity (epsilon'=2310) with low loss sustained in a broad temperature range (-55-201 degrees C), which was close to that of the commercial BaTiO3-based high-temperature capacitors. Transmission electron microscopy with energy dispersive X-ray analysis directly revealed that submicron grains exhibited duplex core-shell structure. The outer shell region was similar to the target composition, whilst a slightly poor content of Sr and Zr presented in the core region. Based on Lichtenecker's effective dielectric function analysis along with Lorentz fit of the temperature dependence of dielectric permittivity, a plausible mechanism explaining the temperature-stable dielectric response in present work was suggested. These results offer an opportunity to achieve the X8 R specification high-temperature capacitors in K0.5Na0.5NbO3 based materials. (C) 2016 Elsevier Ltd. All rights reserved.
引用
收藏
页码:115 / 122
页数:8
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