共 13 条
- [1] [Anonymous], MEASUREMENT SCI TECH
- [2] [Anonymous], SICE ANN C
- [3] [Anonymous], SICE ANN C
- [4] [Anonymous], P WSEAS C ADV APPL M
- [5] [Anonymous], J MACHINERY TOOLS MA
- [6] [Anonymous], EL 97 CHIC IL
- [7] STYLUS PROFILING INSTRUMENT FOR MEASURING STATISTICAL PROPERTIES OF SMOOTH OPTICAL-SURFACES [J]. APPLIED OPTICS, 1981, 20 (10): : 1785 - 1802
- [8] A controlled-force stylus displacement probe [J]. PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1996, 19 (2-3): : 105 - 111
- [10] FORCE MICROSCOPY WITH A BIDIRECTIONAL CAPACITANCE SENSOR [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (09) : 2296 - 2308