Microstructure evolution and mechanical properties of the In-Sn-20Cu composite particles TLP bonding solder joints

被引:12
作者
Yang, Li [1 ,3 ]
Yang, Yao [2 ,3 ]
Zhang, Yaocheng [3 ]
Xu, Feng [3 ]
Qiao, Jian [2 ,3 ]
Lu, Wangzhang [3 ]
Yu, Banglong [2 ,3 ]
机构
[1] Guilin Univ Aerosp Technol, Sch Mech Engn, Guilin 541004, Peoples R China
[2] Soochow Univ, Sch Mech & Elect Engn, Suzhou 215000, Jiangsu, Peoples R China
[3] Changshu Inst Technol, Sch Automot Engn, Suzhou 215500, Jiangsu, Peoples R China
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2020年 / 126卷 / 05期
基金
中国国家自然科学基金;
关键词
Transient liquid phase (TLP) bonding; Microstructure evolution; Intermetallic compound (IMC); Shear strength; Fracture mechanism; LOW-TEMPERATURE; RELIABILITY; STRENGTH; CHIP; DEVICES; GROWTH;
D O I
10.1007/s00339-020-03523-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study, the Cu/In-Sn-20Cu/Cu solder joints were fabricated under the bonding temperature of 260 degrees C, bonding stress of 3 MPa and bonding time of 0.5-60 min by transient liquid phase bonding. The influence of bonding time on the microstructure evolution and the shear strength of the solder joints was investigated. The results indicated that the intermetallic compound in the interface reaction zone was Cu-3(In, Sn) phase, and its thickness was increased continuously with increasing bonding time. The scallop-type Cu-6(In, Sn)(5) phase was formed at the interface of Cu-3(In, Sn)/In-Sn-20Cu composite solder and then gradually grew to connect the island-type Cu-6(In, Sn)(5) phase which formed in the in situ reaction zone. The transformation of Cu-6(In, Sn)(5) phase to Cu-3(In, Sn) phase occurred in the in situ reaction zone after the bonding time reached 15 min. The shear strength of the Cu/In-Sn-20Cu/Cu solder joints was increased first and then decreased with increasing bonding time. The maximum shear strength was 26.54 MPa when the bonding time reached 15 min. The shear fracture mechanism of solder joints transited from brittle fracture to ductile-brittle mixed fracture with increasing bonding time.
引用
收藏
页数:8
相关论文
共 29 条
[1]   Microstructural evolution and mechanical reliability of transient liquid phase sintered joint during thermal aging [J].
Bao, Yudian ;
Wu, Aiping ;
Shao, Huakai ;
Zhao, Yue ;
Liu, Lei ;
Zou, Guisheng .
JOURNAL OF MATERIALS SCIENCE, 2019, 54 (01) :765-776
[2]   Effect of powders on microstructures and mechanical properties for Sn-Ag transient liquid phase bonding in air [J].
Bao, Yudian ;
Wu, Aiping ;
Shao, Huakai ;
Zhao, Yue ;
Zou, Guisheng .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2018, 29 (12) :10246-10257
[3]   Development of new transient liquid phase system Au-Sn-Au for microsystem technology [J].
Bobzin K. ;
Bagcivan N. ;
Zhao L. ;
Ferrara S. ;
Perne J. .
Frontiers of Mechanical Engineering in China, 2010, 5 (4) :370-375
[4]   Strength of joints produced by transient liquid phase bonding in the Cu-Sn system [J].
Bosco, NS ;
Zok, FW .
ACTA MATERIALIA, 2005, 53 (07) :2019-2027
[5]   Strength and reliability of low temperature transient liquid phase bonded Cu-Sn-Cu interconnects [J].
Brincker, M. ;
Soehl, S. ;
Eisele, R. ;
Popok, V. N. .
MICROELECTRONICS RELIABILITY, 2017, 76 :378-382
[6]   Grain structure modification of Cu-Sn IMCs by applying Cu-Zn UBM on transient liquid-phase bonding in novel 3D-IC technologies [J].
Chen, Wei-Yu ;
Song, Rui-Wen ;
Duh, Jenq-Gong .
INTERMETALLICS, 2017, 85 :170-175
[7]   Development of Novel Intermetallic Joints using Thin Film Indium Based Solder by Low Temperature Bonding Technology for 3D IC Stacking [J].
Choi, Won Kyoung ;
Premachandran, C. S. ;
Chiew, Ong Siong ;
Ling, Xie ;
Ebin, Liao ;
Khairyanto, Ahmad ;
Ratmin, Bin ;
Chen, Kelvin ;
Sheng, Wei ;
Thaw, Phyo Phyo ;
Lau, John H. .
2009 IEEE 59TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, VOLS 1-4, 2009, :333-338
[8]   Prediction and Mitigation of Vertical Cracking in High-Temperature Transient Liquid Phase Sintered Joints by Thermomechanical Simulation [J].
Greve, Hannes ;
Moeini, S. Ali ;
McCluskey, Patrick ;
Joshi, Shailesh .
JOURNAL OF ELECTRONIC PACKAGING, 2018, 140 (02)
[9]   Microstructure evolution and mechanical strength evaluation in Ag/Sn/Cu TLP bonding interconnection during aging test [J].
Guo, Qiang ;
Sun, Siyu ;
Zhang, Zhihao ;
Chen, Hongtao ;
Li, Mingyu .
MICROELECTRONICS RELIABILITY, 2018, 80 :144-148
[10]   Interfacial reactions and growth kinetics for intermetallic compound layer between In-48Sn solder and bare Cu substrate [J].
Kim, DG ;
Jung, SB .
JOURNAL OF ALLOYS AND COMPOUNDS, 2005, 386 (1-2) :151-156