A New AFM Nanotribology Method Using a T-Shape Cantilever with an Off-Axis Tip for Friction Coefficient Measurement with Minimized Abbe Error

被引：7

作者：

Liu, Yu ^{[1
]}

Leung, Kar Man ^{[1
]}

Nie, Heng-yong ^{[2
]}

Lau, Woon Ming ^{[2
]}

Yang, Jun ^{[1
]}

机构：

[1] Univ Western Ontario, Dept Mech & Mat Engn, London, ON N6A 5B9, Canada

[2] Univ Western Ontario, London, ON N6G 0J3, Canada

来源：

TRIBOLOGY LETTERS | 2011年 / 41卷 / 01期

基金：

加拿大自然科学与工程研究理事会; 加拿大创新基金会; 加拿大健康研究院;

关键词：

Nanotribology; AFM; T-shape cantilever; Friction coefficient; ATOMIC-FORCE MICROSCOPY; SPRING CONSTANTS; SCALE FRICTION; LATERAL FORCE; CALIBRATION; NANOSCALE; CONTACT; SURFACE;

D O I：

10.1007/s11249-010-9699-9

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

A new AFM (atomic force microscopy) nanotribology method using a T-shape cantilever with an off-axis tip (Nat Nanotechnol 2:507-514, 2007) has been developed for measuring friction coefficient at nanometer scale. In this method, signals due to both bending and twisting of the T-shape AFM cantilever are detected simultaneously. For a T-shape AFM cantilever, the bending is caused by the normal load and the twisting is caused by both the normal and the lateral loads. The twisting generated by the normal load is calibrated in advance. Consequently, the twisting only due to the lateral load can be decoupled from the total lateral voltage signal. And the friction coefficient can be finally determined based on a conversion relationship between the normal and lateral voltage signals of the AFM photodetector. A practical procedure for minimizing Abb, error in friction coefficient measurement has also been introduced. The proposed new method is simple and accurate, and requires the least operation for friction coefficient measurement at nanometer scale.

引用

页码：313 / 318

页数：6