Investigating the optical properties of dislocations by scanning transmission electron microscopy

被引：24
|
作者：
Pennycook, S. J. [1 ]
机构：
[1] Oak Ridge Natl Lab, Div Mat Sci & Technol, Oak Ridge, TN 37831 USA
来源：
SCANNING | 2008年 / 30卷 / 04期
关键词：
cathodoluminescence; dislocations; core structures; scanning transmission electron microscopy; electron energy loss spectroscopy; optical properties;
D O I：
10.1002/sca.20114
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The scanning transmission electron microscope (STEM) allows collection of a number Of simultaneous signals, such as cathodoluminescence (CL), transmitted electron intensity and spectroscopic information from individual localized defects. This review traces the development of CL and atomic resolution imaging from their early inception through to the possibilities that exist today for achieving a true atomic-scale understanding of the optical properties of individual dislocations cores. This review is dedicated to Professor David Holt, a pioneer in this field.
引用
收藏
页码：287 / 298
页数：12
相关论文
共 50 条
  • [1] Important aspects of investigating optical excitations in semiconductors using a scanning transmission electron microscope
    Stoeger-Pollach, Michael
    Bukvisova, Krystina
    Zenz, Keanu
    Stoeger, Leo
    Scales, Ze
    JOURNAL OF MICROSCOPY, 2024, 293 (03) : 138 - 145
  • [2] Material structure, properties, and dynamics through scanning transmission electron microscopy
    Pennycook, Stephen J.
    Li, Changjian
    Li, Mengsha
    Tang, Chunhua
    Okunishi, Eiji
    Varela, Maria
    Kim, Young-Min
    Jang, Jae Hyuck
    JOURNAL OF ANALYTICAL SCIENCE AND TECHNOLOGY, 2018, 9
  • [3] Material structure, properties, and dynamics through scanning transmission electron microscopy
    Stephen J. Pennycook
    Changjian Li
    Mengsha Li
    Chunhua Tang
    Eiji Okunishi
    Maria Varela
    Young-Min Kim
    Jae Hyuck Jang
    Journal of Analytical Science and Technology, 9
  • [4] A comparison of energy dispersive spectroscopy in transmission scanning electron microscopy with scanning transmission electron microscopy
    Carter, Jennifer L. W.
    Uz, Tugce Karakulak
    Ibrahim, Buhari
    Pigott, Jeffrey S.
    Gordon, Jerard, V
    ULTRAMICROSCOPY, 2025, 270
  • [5] Properties of dislocations in epitaxial ZnO layers analyzed by transmission electron microscopy
    Müller, E
    Livinov, D
    Gerthsen, D
    Kirchner, C
    Waag, A
    Oleynik, N
    Dadgar, A
    Krost, A
    ZINC OXIDE - A MATERIAL FOR MICRO- AND OPTOELECTRONIC APPLICATIONS, 2005, 194 : 99 - 111
  • [6] COMPRESSIVE SCANNING TRANSMISSION ELECTRON MICROSCOPY
    Nicholls, D.
    Robinson, A.
    Wells, J.
    Moshtaghpour, A.
    Bahri, M.
    Kirkland, A.
    Browning, N.
    2022 IEEE INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH AND SIGNAL PROCESSING (ICASSP), 2022, : 1586 - 1590
  • [7] Analysis of crystal defects by scanning transmission electron microscopy (STEM) in a modern scanning electron microscope
    Sun, Cheng
    Mueller, Erich
    Meffert, Matthias
    Gerthsen, Dagmar
    ADVANCED STRUCTURAL AND CHEMICAL IMAGING, 2019, 5
  • [8] Atmospheric Pressure Scanning Transmission Electron Microscopy
    de Jonge, Niels
    Bigelow, Wilbur C.
    Veith, Gabriel M.
    NANO LETTERS, 2010, 10 (03) : 1028 - 1031
  • [9] On the Progress of Scanning Transmission Electron Microscopy (STEM) Imaging in a Scanning Electron Microscope
    Sun, Cheng
    Mueller, Erich
    Meffert, Matthias
    Gerthsen, Dagmar
    MICROSCOPY AND MICROANALYSIS, 2018, 24 (02) : 99 - 106
  • [10] Application of scanning electron diffraction in the transmission electron microscope for the characterisation of dislocations in minerals
    Nzogang, Billy C.
    Mussi, Alexandre
    Cordier, Patrick
    MINERALOGICAL MAGAZINE, 2019, 83 (01) : 71 - 79
12345