Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree

被引：1

作者：

Tang, Xun ^{[1
]}

Cheng, Wu-Tung ^{[2
]}

Guo, Ruifeng ^{[2
]}

Tang, Huaxing ^{[2
]}

Reddy, Sudhakar M. ^{[1
]}

机构：

[1] Univ Iowa, Iowa City, IA 52242 USA

[2] Mentor Graph Corp, Wilsonville, OR USA

来源：

2011 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT) | 2011年

关键词：

D O I：

10.1109/DFT.2011.37

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

In this work, new techniques are proposed to improve diagnosis of multiple faults based on fault-tuple equivalence tree (FTET). After carefully analyzing relations between faults in FTET, the concept of conflicts is proposed and utilized to locate the faulty sites. The proposed diagnosis algorithm can accurately identify the defect locations and also identify the physical fault types, which was demonstrated by experimental results on large ISCAS89 and ITC99 circuits.

引用

页码：217 / 225

页数：9

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