Evidence of lateral heat transfer during laser assisted atom probe tomography analysis of large band gap materials

被引：28

作者：

Bachhav, M. N. ^{[1
]}

Danoix, R. ^{[1
]}

Vurpillot, F. ^{[1
]}

Hannoyer, B. ^{[1
]}

Ogale, S. B. ^{[2
]}

Danoix, F. ^{[1
]}

机构：

[1] Univ Rouen, Grp Phys Mat, CNRS, UMR 6634, F-76801 St Etienne, France

[2] Natl Chem Lab, Phys & Mat Chem Div, Pune 411008, Maharashtra, India

来源：

APPLIED PHYSICS LETTERS | 2011年 / 99卷 / 08期

关键词：

THERMAL-CONDUCTIVITY; OXIDE LAYER; SILICON; TEMPERATURE;

D O I：

10.1063/1.3622647

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Investigation of wustite (FeO), iron (Fe), and silicon (Si) specimens by infrared laser assisted three dimensional atom probe tomography shows evidence of confined surface absorption of the laser energy as the mechanism of laser assisted field evaporation for high band gap materials. The absorption region is shown to be located on the laser illumination side, close to the specimen apex. A simple model based on thermal diffusivity and spatial extent of the absorption region is derived and applied to the experimental results. The values of thermal diffusivity thus obtained are in good agreement with the published data. (C) 2011 American Institute of Physics. [doi:10.1063/1.3622647]

引用

页数：3

共 25 条

[1] Investigation of wustite (Fe1-xO) by femtosecond laser assisted atom probe tomography [J].

Bachhav, M. ;

Danoix, R. ;

Danoix, F. ;

Hannoyer, B. ;

Ogale, S. ;

Vurpillot, F. .

ULTRAMICROSCOPY, 2011, 111 (06) :584-588

[2] AN ATOM-PROBE FOR 3-DIMENSIONAL TOMOGRAPHY [J].

BLAVETTE, D ;

BOSTEL, A ;

SARRAU, JM ;

DECONIHOUT, B ;

MENAND, A .

NATURE, 1993, 363 (6428) :432-435

[3] Advances in pulsed-laser atom probe: Instrument and specimen design for optimum performance [J].

Bunton, Joseph H. ;

Olson, Jesse D. ;

Lenz, Daniel R. ;

Kelly, Thomas F. .

MICROSCOPY AND MICROANALYSIS, 2007, 13 (06) :418-427

[4] Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe [J].

Cerezo, A ;

Smith, GDW ;

Clifton, PH .

APPLIED PHYSICS LETTERS, 2006, 88 (15)

[5] PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS [J].

CEREZO, A ;

GROVENOR, CRM ;

SMITH, GDW .

JOURNAL OF MICROSCOPY-OXFORD, 1986, 141 :155-170

[6] Laser-assisted atom probe analysis of zirconia/spinel nanocomposite ceramics [J].

Chen, Y. M. ;

Ohkubo, T. ;

Kodzuka, M. ;

Morita, K. ;

Hono, K. .

SCRIPTA MATERIALIA, 2009, 61 (07) :693-696

[7] Investigation of an oxide layer by femtosecond-laser-assisted atom probe tomography [J].

Gault, B ;

Menand, A ;

de Geuser, F ;

Deconihout, B ;

Danoix, R .

APPLIED PHYSICS LETTERS, 2006, 88 (11)

[8] Some aspects of the silicon behaviour under femtosecond pulsed laser field evaporation [J].

Gilbert, M. ;

Vurpillot, F. ;

Vella, A. ;

Bernas, H. ;

Deconihout, B. .

ULTRAMICROSCOPY, 2007, 107 (09) :767-772

[9] Optical near-field absorption at a metal tip far from plasmonic resonance [J].

Houard, J. ;

Vella, A. ;

Vurpillot, F. ;

Deconihout, B. .

PHYSICAL REVIEW B, 2010, 81 (12)

[10] DETERMINING THE FIELD EMITTER TEMPERATURE DURING LASER IRRADIATION IN THE PULSED LASER ATOM PROBE [J].

KELLOGG, GL .

JOURNAL OF APPLIED PHYSICS, 1981, 52 (08) :5320-5328

← 1 2 3 →