Pole-tip protrusion effect on head-disk interface at low flying clearance

被引:6
作者
Gong, ZQ [1 ]
Liu, JJ
机构
[1] MMC Technol, San Jose, CA 95131 USA
[2] Samsung Informat Syst Amer, San Jose, CA 95134 USA
关键词
contact hysteresis; flying clearance; head-disk interface; pole-tip protrusion;
D O I
10.1109/TMAG.2005.855245
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
As the head-disk flying clearance is reduced below 10 nm or less, write-current-induced pole-tip protrusion (PTP) plays a significant role in tribology performance at the head-disk interface. PTP effect on the head-disk interaction at close proximity flying is studied through a new approach utilizing controlled PTP with acoustic emission sensing. Actual flying clearance can be measured and controlled through this technique. The PTP contact hysteresis phenomenon is investigated and used to characterize the lubricant properties at head-disk interface. The dependence of lubricant thickness and bonded lubricant ratio to contact hysteresis is reported. Different features of head pickup and tube redistribution due to PTP effect are discussed.
引用
收藏
页码:3019 / 3021
页数:3
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