Fundamental Aspects of Near-Field Emission Scanning Electron Microscopy

被引：21
|
作者：
Zanin, D. A. [1 ]
Cabrera, H. [1 ]
De Pietro, L. G. [1 ]
Pikulski, M. [1 ]
Goldmann, M. [1 ]
Ramsperger, U. [1 ]
Pescia, D. [1 ]
Xanthakis, John P. [2 ]
机构：
[1] ETH, Festkorperphys Lab, CH-8093 Zurich, Switzerland
[2] Natl Tech Univ Athens, Dept Elect & Comp Engn, Athens 15700, Greece
来源：
ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 170 | 2012年 / 170卷
关键词：
D O I：
10.1016/B978-0-12-394396-5.00005-1
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：227 / 258
页数：32
相关论文
共 50 条
  • [31] Differential near-field scanning optical microscopy
    Ozcan, Aydogan
    Cubukcu, Ertugrul
    Bilenca, Alberto
    Crozier, Kenneth B.
    Bouma, Brett E.
    Capasso, Federico
    Tearney, Guillermo J.
    NANO LETTERS, 2006, 6 (11) : 2609 - 2616
  • [32] Contact scanning near-field optical microscopy
    Lapshin, D.A.
    Reshetov, V.N.
    Sekatskii, S.K.
    Letokhov, V.S.
    JETP Letters (Translation of Pis'ma v Zhurnal Eksperimental'noi Teoreticheskoi Fiziki), 1998, 67 (04):
  • [33] Applications of near-field scanning optical microscopy
    Hess, HF
    Betzig, E
    SEMICONDUCTOR CHARACTERIZATION: PRESENT STATUS AND FUTURE NEEDS, 1996, : 395 - 398
  • [34] Coaxial probes for scanning near-field microscopy
    Leinhos, T
    Rudow, O
    Stopka, M
    Vollkopf, A
    Oesterschulze, E
    JOURNAL OF MICROSCOPY, 1999, 194 : 349 - 352
  • [35] Contact scanning near-field optical microscopy
    Lapshin, DA
    Sekatskii, SK
    Letokhov, VS
    Reshetov, VN
    JETP LETTERS, 1998, 67 (04) : 263 - 268
  • [36] Near-field scanning optical microscopy and polymers
    Rucker, M
    DeSchryver, FC
    Vanoppen, P
    Jeuris, K
    DeFeyter, S
    Hotta, J
    Masuhara, H
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 131 (1-4): : 30 - 37
  • [37] Near-field scanning optical microscopy of nanostructures
    Department of Chemistry, University of California, Santa Barbara, CA 93106-9510, United States
    Phase Transitions, 1 (27-57):
  • [38] SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM)
    POHL, DW
    FISCHER, UC
    DURIG, UT
    JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 853 - 861
  • [39] Scanning near-field Raman microscopy on ferroelectrics
    Sakai, A
    Sasaki, N
    Tamate, T
    Ninomiya, T
    FERROELECTRICS, 2003, 284 : 189 - 193
  • [40] Photoreflectance Near-field Scanning Optical Microscopy
    Paulson, C
    Hawkins, B
    Sun, JX
    Ellis, AB
    McCaughan, L
    Kuech, TF
    OPTICAL MICROSTRUCTURAL CHARACTERIZATION OF SEMICONDUCTORS, 2000, 588 : 13 - 17
12345