EIS comparative study and critical Equivalent Electrical Circuit (EEC) analysis of the native oxide layer of additive manufactured and wrought 316L stainless steel

被引:114
作者
Revilla, Reynier I. [1 ]
Wouters, Benny [1 ]
Andreatta, Francesco [2 ]
Lanzutti, Alex [2 ]
Fedrizzi, Lorenzo [2 ]
De Graeve, Iris [1 ]
机构
[1] VUB, Dept Chem & Mat, Res Grp Electrochem & Surface Engn SURF, Pleinlaan 2, B-1050 Brussels, Belgium
[2] Univ Udine, Polytech Dept Engn & Architecture, Via Cotonificio 108, I-33100 Udine, Italy
关键词
Additive manufacturing; 316L stainless steel; Electrochemical impedance spectroscopy; CORROSION-RESISTANCE; RESISTIVITY DISTRIBUTIONS; PITTING CORROSION; LASER; BEHAVIOR; FILMS; MICROSTRUCTURE; CONSTANT; XPS; MOLYBDENUM;
D O I
10.1016/j.corsci.2020.108480
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this work, a comparative electrochemical impedance spectroscopy (EIS) study of the native oxide layer of selective laser melted and wrought 316L stainless steel is conducted. A careful examination of the data is carried out in order to properly identify the appropriate model to fit the EIS response. From the parameters calculated by fitting the EIS data and a complementary XPS analysis, the electrical and dielectric characteristics of the passive oxide layers of the specimens were obtained. Clear differences were noticed between the two materials, which could definitely contribute to the overall understanding of the corrosion behavior of these materials.
引用
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页数:10
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