Adaptive analysis of yield line patterns in plates with the arbitrary Lagrangian-Eulerian method

被引：17

作者：

Askes, H

Rodríguez-Ferran, A

Huerta, A

机构：

[1] Delft Univ Technol, Dept Civil Engn, NL-2600 GA Delft, Netherlands

[2] Univ Politecn Catalunya, ETS Ingn Caminos, Dept Matemat Aplicada 3, ES-08034 Barcelona, Spain

来源：

COMPUTERS & STRUCTURES | 1999年 / 70卷 / 03期

关键词：

plates; yield lines; arbitrary Lagrangian-Eulerian; mesh adaptivity; remesh indicators;

D O I：

10.1016/S0045-7949(98)00188-6

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

Plasticity models provide suitable tools to describe the so-called yield line pattern that occurs with the failure of plates. However, in a Lagrangian description a huge number of finite elements are needed for accurate solutions. Accuracy can be combined with low computer costs by means of the arbitrary Lagrangian-Eulerian (ALE) method. With the ALE method, the finite element mesh is automatically refined in the yield lines. A new remesh indicator is proposed that captures newly appearing yield lines as well as already formed yield lines. Numerical examples show the effectiveness of this approach. (C) 1998 Elsevier Science Ltd. All rights reserved.

引用

页码：257 / 271

页数：15

共 24 条

[21] SIMULATION OF FORMING PROCESSES, USING THE ARBITRARY EULERIAN-LAGRANGIAN FORMULATION [J].