Characterization of birefringent material using polarization-controlled terahertz spectroscopy

被引:28
作者
Zhang, Liangliang [1 ,3 ]
Zhong, Hua [2 ]
Deng, Chao [1 ]
Zhang, Cunlin [1 ]
Zhao, Yuejin [3 ]
机构
[1] Capital Normal Univ, Beijing Key Lab Terahertz Spect & Imaging, Beijing 100048, Peoples R China
[2] Peking Univ, Sch Engn, Beijing 100871, Peoples R China
[3] Beijing Inst Technol, Dept Opt Engn, Beijing 100081, Peoples R China
基金
中国国家自然科学基金;
关键词
QUARTER-WAVE PLATE;
D O I
10.1364/OE.18.020491
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present a polarization-controlled terahertz(THz) spectroscopy method to characterize the birefringent materials. The polarization of THz wave was controlled by changing the relative phase of the fundamental and second-harmonic waves in the two-color laser-induced air plasma THz generation configuration. The optical axis orientation was investigated through detecting one component of the transmitted THz electric field by continuously changing the electric field direction of the linearly polarized incident THz wave. This work demonstrates that the polarization-controlled THz spectroscopy can be used to study the anisotropy of the inner structure for birefringent materials. (C) 2010 Optical Society of America
引用
收藏
页码:20491 / 20497
页数:7
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