OPTOPHYSICAL MEASUREMENTS IN CHEMICAL PHYSICS, PHYSICAL CHEMISTRY, AND NANOCHEMISTRY

被引：0

作者：

Muravskaya, N. P. ^{[1
]}

Lakhov, V. M. ^{[2
]}

Kaidalov, S. A. ^{[1
]}

Ivanov, A. V. ^{[1
]}

机构：

[1] All Russia Res Inst Optophys Measurements VNIIOFI, Moscow, Russia

[2] Fed Agcy Tech Regulat & Metrol, Moscow, Russia

来源：

MEASUREMENT TECHNIQUES | 2010年 / 53卷 / 07期

关键词：

metrological characteristics; standards; photoelectric devices; electron-optical diagnostics; high-speed processes;

D O I：

10.1007/s11018-010-9584-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The results of investigations of the metrological characteristics of standards and photoelectric instruments for electron-optical diagnostics and high-speed optophysical measurements, developed at the All-Russia Research Institute of Optophysical Measurements from 1965 to 2010 are presented.

引用

页码：828 / 832

页数：5