Substrate effect on mechanical characterizations of aluminum-doped zinc oxide transparent conducting films

被引:20
作者
Huang, Yi-Chung [1 ]
Chang, Shou-Yi [1 ]
机构
[1] Natl Chung Hsing Univ, Dept Mat Sci & Engn, Taichung 40227, Taiwan
关键词
Substrate effect; Mechanical properties; Interface adhesion; THIN-FILMS; INDENTATION; NANOINDENTATION; SIZE; HARDNESS; CONTACT; SILICON;
D O I
10.1016/j.surfcoat.2010.02.073
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The measurements of thin-film mechanical properties are generally influenced by the elastic and plastic responses of substrates and consequently may be inaccurate. Thus in this study, the effects of three different substrates, including sapphire, glass and polyimide, on the mechanical characterizations of aluminum-doped zinc oxide transparent conducting films are evaluated. From nanoindentation tests, it was found that a high film/substrate hardness ratio contributed an early-initiated substrate effect. For a hard film/soft substrate system (zinc oxide on polyimide), the measured hardness and elastic modulus markedly dropped at very small indentation depths due to the insufficient strength of the soft substrate to sustain the applied stress. A modification of the Bhattacharya model and the calibration of the King model were also made in this study; some important factors were established. Moreover, the interface adhesion energy between the film and soft substrate, measured by nanoscratch, was high because the compliant deformation of the soft substrate released accumulated stresses and then retarded interface delamination. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:3147 / 3153
页数:7
相关论文
共 30 条
[1]   ANALYSIS OF ELASTIC AND PLASTIC-DEFORMATION ASSOCIATED WITH INDENTATION TESTING OF THIN-FILMS ON SUBSTRATES [J].
BHATTACHARYA, AK ;
NIX, WD .
INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES, 1988, 24 (12) :1287-1298
[2]  
Buckle H., 1973, The science of hardness testing and its research applications, P453
[3]   Nano-indentation of coatings [J].
Bull, SJ .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2005, 38 (24) :R393-R413
[4]   FAILURE MODES IN SCRATCH ADHESION TESTING [J].
BULL, SJ .
SURFACE & COATINGS TECHNOLOGY, 1991, 50 (01) :25-32
[5]   Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness [J].
Cao, Yifang ;
Allameh, Seyed ;
Nankivil, Derek ;
Sethiaraj, Steve ;
Otiti, Tom ;
Soboyejo, Wole .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2006, 427 (1-2) :232-240
[6]   Preparation and mechanical properties of aluminum-doped zinc oxide transparent conducting films [J].
Chang, Shou-Yi ;
Hsiao, Yen-Chih ;
Huang, Yi-Chung .
SURFACE & COATINGS TECHNOLOGY, 2008, 202 (22-23) :5416-5420
[7]   Mechanical property analyses of porous low-dielectric-constant films for stability evaluation of multilevel-interconnect structures [J].
Chang, SY ;
Chang, HL ;
Lu, YC ;
Jang, SM ;
Lin, SJ ;
Liang, MS .
THIN SOLID FILMS, 2004, 460 (1-2) :167-174
[8]   Size dependent nanoindentation of a soft film on a hard substrate [J].
Chen, SH ;
Liu, L ;
Wang, TC .
ACTA MATERIALIA, 2004, 52 (05) :1089-1095
[9]   ELASTIC CONTACT VERSUS INDENTATION MODELING OF MULTILAYERED MATERIALS [J].
GAO, HJ ;
CHIU, CH ;
LEE, J .
INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES, 1992, 29 (20) :2471-2492
[10]   Determination of elastoplastic properties by instrumented sharp indentation [J].
Giannakopoulos, AE ;
Suresh, S .
SCRIPTA MATERIALIA, 1999, 40 (10) :1191-1198