Formation of interstitial silicon defects in Si- and Si,P-doped nanodiamonds and thermal susceptibilities of SiV- photoluminescence band

被引:18
作者
Choi, Sumin [1 ]
Agafonov, Viatcheslav N. [2 ]
Davydov, Valery A. [3 ]
Kulikova, Ludmila F. [3 ]
Plakhotnik, Taras [1 ]
机构
[1] Univ Queensland, Sch Math & Phys, Brisbane, Qld 4072, Australia
[2] Univ F Rabelais, UMR CNRS 7347, GREMAN, F-37200 Tours, France
[3] Russian Acad Sci, LF Vereshchagin Inst High Pressure Phys, Moscow 108840, Russia
关键词
nanodiamond; crystal grows; color center; thermometry; photoluminescence; N-TYPE DIAMOND; VACANCY CENTERS; THERMOMETRY;
D O I
10.1088/1361-6528/ab72bb
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have produced two types of synthetic nanodiamonds Si- and Si,P-doped and have characterized the thermal susceptibilities of the spectral band of silicon-vacancy (SiV-) centers at approximately 740 nm in each case. The covered temperature range from 295 to 350 K is of interest for thermometry in biological systems. Comparison of the relative brightness of the Si- and Si,P-doped crystals shows that phosphorous significantly increases average concentration and homogeneity of distribution of SiV- centers in nanodiamonds. Moreover, linear dependence on temperature of the zero-phonon line width in Si-doped crystals is 0.061(2) nm K-1 but is 0.047(3) nm K-1, about 35% smaller in Si,P-doped nanodiamonds. This proves control of SiV- properties with additional chemical doping and close proximity of Si and P atoms.
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页数:7
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