Nanoscopic imaging of oxidized graphene monolayer using tip-enhanced Raman scattering

被引：16

作者：

Smolsky, Joseph M. ^{[1
]}

Krasnoslobodtsev, Alexey V. ^{[1
]}

机构：

[1] Univ Nebraska, Dept Phys, 6001 Dodge St, Omaha, NE 68182 USA

来源：

NANO RESEARCH | 2018年 / 11卷 / 12期

关键词：

graphene; Raman spectroscopy; tip-enhanced Raman scattering; graphene oxidation; CHEMICAL-VAPOR-DEPOSITION; SINGLE-LAYER GRAPHENE; MECHANICAL-PROPERTIES; OXIDE; DEFECTS; SURFACE; SPECTROSCOPY; GRAPHITE; ORIGIN; INTERCALATION;

D O I：

10.1007/s12274-018-2158-x

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Tip-enhanced Raman scattering (TERS) can be used for the structural and chemical characterization of materials with a nanoscale resolution, and offers numerous advantages compared to other forms of imaging. We use TERS to track the local structural features of a CVD-grown graphene monolayer. Ag nanoparticles were added to AFM probes using ion-beam sputtering in order to make them TERS-active. Such modification provides probes with large factors of enhancement and good reproducibility. TERS measurements on graphene show an emergence of a defect-induced D-Raman band and a strain-induced shoulder of the graphene's G-band. Comparison of TERS results with micro-Raman for oxidized graphene suggests that local oxidation occurs with the introduction of sp(3) defects, under TERS conditions.

引用

页码：6346 / 6359

页数：14

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