INTERFEROMETRY TECHNIQUE FOR REFRACTIVE INDEX MEASUREMENTS AT SUBCENTIMETER WAVELENGTHS

被引：17

作者：

Andrushchak, N. A. ^{[1
]}

Syrotynsky, O. I. ^{[1
]}

Karbovnyk, I. D. ^{[2
]}

Bobitskii, Ya. V. ^{[1
]}

Andrushchak, A. S. ^{[1
]}

Kityk, A. V. ^{[3
]}

机构：

[1] Lviv Polytech Natl Univ, UA-79013 Lvov, Ukraine

[2] Ivan Franko Natl Univ Lviv, Dept Elect, UA-79017 Lvov, Ukraine

[3] Czestochowa Tech Univ, Fac Elect Engn, PL-42200 Czestochowa, Poland

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2011年 / 53卷 / 05期

关键词：

refractive index; subcentimeter wavelengths; interferometry technique; DIELECTRIC MEASUREMENT; COMPLEX PERMITTIVITY; WAVE-GUIDE; BWO SPECTROSCOPY; MILLIMETER; GHZ; LIQUIDS; SPECTRA;

D O I：

10.1002/mop.25944

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We demonstrate the interferometry technique for the refractive index measurements at subcentimeter wavelengths. The method is based on a path length sweeping being introduced into one of the interferometer arms, while the sample is tilted out of its normal position with respect to the incident electromagnetic radiation. The determination of the refractive index is realized through the recording of the interference patterns at several tilt angles. (C) 2011 Wiley Periodicals, Inc. Microwave Opt Technol Lett 53: 1193-1196, 2011; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.25944

引用

页码：1193 / 1196

页数：5

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