Evaluation and suppression of systematic errors in optical subwavelength gratings

被引:0
|
作者
Schnabel, B [1 ]
Kley, EB [1 ]
机构
[1] Leica Microsyst Lithog GmbH, D-07745 Jena, Germany
关键词
subwavelength gratings; grating ghosts; electron beam lithography;
D O I
10.1117/12.402777
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Optical subwavelength gratings are of growing interest for the realization of special optical effects such as artificial birefringence or antireflection layers, for example. The optical properties of such elements strongly depend on the accuracy of the fabrication technology and tools. Although e-beam lithography is known to be a high-accuracy fabrication method, even with this technology systematic grating errors may occur which affect the optical function. One example is the existence of grating ghosts (i.e. undesired propagating diffraction orders) which may occur even in the case of subwavelength grating periods. in this paper we describe how this effect is related to the address grid of the e-beam writer. Measurements of the diffraction spectrum of subwavelength gratings indicate the importance of this effect. The adaption of grating period and address grid allows the fabrication of ghost-free subwavelength gratings.
引用
收藏
页码:132 / 137
页数:6
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