Analytical Modeling of Current-Voltage Characteristics of Phosphorene Based Field Effect Transistor

被引:0
|
作者
Zangi, Shiva [1 ]
Ahmadi, Mohammad Taghi [2 ,3 ]
Ismail, Razali [3 ]
机构
[1] Urmia Pardis Univ, Phys Dept, Fac Sci, Orumiyeh 5756151818, Iran
[2] Urmia Univ, Phys Dept, Fac Sci, Orumiyeh 5756151818, Iran
[3] Univ Teknol Malaysia, Elect & Comp Engn Dept, Fac Elect Engn, Johor Baharu 81310, Malaysia
关键词
Phosphorene; Conductance; Current-Voltage Characteristic; Modeling; Phosphorene Based FET;
D O I
10.1166/jno.2018.2377
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Phosphorene, a new two-dimensional semiconductor, with its outstanding electro-optical and transport features has been studied extremely in recent years. However, the modeling of its interesting properties needs to be explored in more details. In this paper, an analytical model for conductance variations in the proposed phosphorene based field effect transistor is presented based on phosphorene energy dispersion relation and a tunable behaviour due to the alteration of gate voltage is reported. Moreover, the current-voltage characteristic of the phosphorene based nano device has been analyzed theoretically and an acceptable I-oN/I-OFF ratio about 10(5) is calculated for different bias values. In addition, data from the suggested current model is compared with the extracted experimental data which shows good agreement and confirms the validity of the suggested model in a desirable manner. Hence, it should be noted that the outcome of this paper can be extremely useful in the analysis of phosphorene based nano devices especially nano-sensors.
引用
收藏
页码:1478 / 1481
页数:4
相关论文
共 50 条
  • [1] Current-Voltage Characteristics of Bilayer Graphene Nanoribbon Field Effect Transistor
    Mousavi, S. Mahdi
    Ahmadi, M. Taghi
    Nilghaz, Azadeh
    Samadi, Javad
    Kiani, M. Javad
    Anwar, Sohail
    Ismail, Razali
    JOURNAL OF COMPUTATIONAL AND THEORETICAL NANOSCIENCE, 2013, 10 (03) : 738 - 741
  • [2] Extracting parameters from current-voltage characteristics of pentacene field-effect transistor in saturation region
    Yakuphanoglu, F.
    Mansouri, S.
    Bourguiga, R.
    SYNTHETIC METALS, 2012, 162 (11-12) : 918 - 923
  • [3] Comparison of Current-Voltage Characteristics of Molybdenum Disulfide and Molybdenum Diselenide Channel Material Based Field Effect Transistor to optimize Conductance
    Ziyauddin, Shaik
    Deepak, A.
    Somasundaram, Jayalakshmi
    2022 14TH INTERNATIONAL CONFERENCE ON MATHEMATICS, ACTUARIAL SCIENCE, COMPUTER SCIENCE AND STATISTICS (MACS), 2022,
  • [4] Current-voltage characteristics influenced by the nanochannel diameter and surface charge density in a fluidic field-effect-transistor
    Singh, Kunwar Pal
    Guo, Chunlei
    PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2017, 19 (24) : 15701 - 15708
  • [5] Ambipolar Phosphorene Field Effect Transistor
    Das, Saptarshi
    Demarteau, Marcel
    Roelofs, Andreas
    ACS NANO, 2014, 8 (11) : 11730 - 11738
  • [6] An analytical model to calculate the current-voltage characteristics of AlGaN/GaN HEMTs
    Tijent, F. Z.
    Faqir, M.
    Voss, P. L.
    Chouiyakh, H.
    Essadiqi, El H.
    JOURNAL OF COMPUTATIONAL ELECTRONICS, 2022, 21 (03) : 644 - 653
  • [7] Modeling of current-voltage characteristics of thin film solar cells
    Mannan, M. A.
    Anjan, M. S.
    Kabir, M. Z.
    SOLID-STATE ELECTRONICS, 2011, 63 (01) : 49 - 54
  • [8] Modeling of current-voltage characteristics of CdS/CdTe solar cells
    Anjan, M. S.
    Kabir, M. Z.
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2011, 208 (08): : 1813 - 1816
  • [9] Effect of dipole moment on current-voltage characteristics of single molecules
    Hoft, R. C.
    Ford, M. J.
    Cortie, M. B.
    2006 INTERNATIONAL CONFERENCE ON NANOSCIENCE AND NANOTECHNOLOGY, VOLS 1 AND 2, 2006, : 77 - +
  • [10] Photoconductivity and Current-Voltage Characteristics of Thin DNA Films: Experiments and Modeling
    Venkatramani, Ravindra
    Zang, De Yu
    Oh, Choon
    Grote, James
    Beratan, David
    NANOBIOSYSTEMS: PROCESSING, CHARACTERIZATION, AND APPLICATIONS II, 2009, 7403