Real-time and high-speed measurements of charging processes on dielectric surface in vacuum

被引：16
|
作者：
Suzuki, K
Kato, K
Hakamata, Y
Okubo, H
机构：
[1] Nagoya Univ, Dept Elect Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan
[2] Hitachi Ltd, Hitachi, Ibaraki 3168501, Japan
[3] Nagoya Univ, Dept Elect Engn, Chikusa Ku, Nagoya, Aichi 4648603, Japan
来源：
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION | 2003年 / 10卷 / 04期
关键词：
vacuum; charging; dielectrics; triple-junction; electron emission;
D O I：
10.1109/TDEI.2003.1219638
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In order to investigate the charging mechanisms of solid dielectrics in vacuum, we constructed real-time and high-speed measurement systems for charge density, current pulse, light emission and applied voltage. By applying a negative dc ramped voltage to an electrode with a cathode triple-junction (TJ), we measured the temporal variation of surface charge accumulation and current pulse waveforms expressing the electron emission from TJ, by electrostatic probes. From the measurement results, we explain the step like charging process and propose an electron emission model by taking the electric field and its relaxation by charging into account. In addition, we elucidate the relationship between the charging process and the location of electron emission.
引用
收藏
页码：563 / 568
页数：6
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