Ultrafast structural changes measured by time-resolved X-ray diffraction

被引：107
作者：
Larsson, J
Heimann, PA
Lindenberg, AM
Schuck, PJ
Bucksbaum, PH
Lee, RW
Padmore, HA
Wark, JS
Falcone, RW [1 ]
机构：
[1] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Accelerator & Fus Res, Berkeley, CA 94720 USA
[3] Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA
[4] Univ Michigan, Ctr Ultrafast Opt Sci, Ann Arbor, MI 48109 USA
[5] Univ Calif Lawrence Livermore Natl Lab, Livermore, CA 94551 USA
[6] Univ Oxford, Dept Phys, Clarendon Lab, Oxford OX1 3PU, England
[7] Univ Calif Berkeley, Lawrence Berkeley Lab, Ctr Beam Phys, Accelerator & Fus Res Div, Berkeley, CA 94720 USA
来源：
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 66卷 / 06期
关键词：
D O I：
10.1007/s003390050719
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
High-intensity X-ray pulses from third-generation synchrotron sources make it possible to study the temporal dynamics of rapidly evolving materials. We report a study of rapid and reversible disordering of the structure of an InSb crystal induced by an ultrashort laser pulse. A novel crosscorrelation detection technique is described, which allowed us to observe rapid changes in X-ray diffraction that occur on a time-scale of less than 2 ps.
引用
收藏
页码：587 / 591
页数：5
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