Application of a Markov model to the measurement, simulation, and diagnosis of an iterative design process

被引:3
作者
Johnson, EW [1 ]
Castillo, LA [1 ]
Brockman, JB [1 ]
机构
[1] UNIV NOTRE DAME,DEPT COMP SCI & ENGN,NOTRE DAME,IN 46556
来源
33RD DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 1996 | 1996年
关键词
D O I
10.1109/DAC.1996.545569
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:185 / 188
页数:4
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