Spectroscopy of light emission from a Scanning Tunneling Microscope in air

被引：20
|
作者：
Pechou, R
Coratger, R
Girardin, C
Ajustron, F
Beauvillain, J
机构：
[1] Centre d'Élaboration des Matériaux et d'Études Structurales, 31055 Toulouse Cedex
来源：
JOURNAL DE PHYSIQUE III | 1996年 / 6卷 / 11期
关键词：
D O I：
10.1051/jp3:1996195
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Light emission has been detected at the tip-sample junction of a Scanning Tunneling Microscope (S.T.M.) in air on noble metallic surfaces. A spectroscopic study of emitted photons for Au-Au and PtIr-Au tunneling junctions is presented. The general aspect of the spectra depends on the materials used in the junctions; a study of the spectra as a function of tunneling current and surface bias voltage reveals similar and reproducible characteristics.
引用
收藏
页码：1441 / 1450
页数：10
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