Radiation-Hardened 14T SRAM Bitcell With Speed and Power Optimized for Space Application

被引:109
|
作者
Peng, Chunyu [1 ]
Huang, Jiati [1 ]
Liu, Changyong [1 ]
Zhao, Qiang [1 ]
Xiao, Songsong [1 ]
Wu, Xiulong [1 ]
Lin, Zhiting [1 ]
Chen, Junning [1 ]
Zeng, Xuan [2 ]
机构
[1] Anhui Univ, Sch Elect & Informat Engn, Hefei 230601, Anhui, Peoples R China
[2] Fudan Univ, Sch Microelect, ASIC & Syst State Key Lab, Shanghai 201203, Peoples R China
基金
中国国家自然科学基金;
关键词
High speed; low power; radiation-hardened SRAM; single-event-multiple-node upsets (SEMNUs); Ssingle-event upset (SEU); EVENT TRANSIENTS; DESIGN; TOLERANT; CELL; UPSET; SEU;
D O I
10.1109/TVLSI.2018.2879341
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, a novel radiation-hardened 14-transistor SRAM bitcell with speed and power optimized [radiation-hardened with speed and power optimized (RSP)-14T] for space application is proposed. By circuit-and layout-level optimization design in a 65-nm CMOS technology, the 3-D TCAD mixed-mode simulation results show that the novel structure is provided with increased resilience to single-event upset as well as single-event-multiple-node upsets due to the charge sharing among OFF-transistors. Moreover, the HSPICE simulation results show that the write speed and power consumption of the proposed RSP-14T are improved by similar to 65% and similar to 50%, respectively, compared with those of the radiation hardened design (RHD)-12T memory cell.
引用
收藏
页码:407 / 415
页数:9
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