共 33 条
Terahertz time-domain spectroscopy of NiOx thin films
被引:0
作者:
Ha, Taewoo
[1
]
Choi, Kyujin
[1
]
Lee, Cheol Hyeok
[1
]
Lee, Kimoon
[1
]
Im, Seongil
[1
]
Kim, Jae Hoon
[1
]
机构:
[1] Yonsei Univ, Dept Phys, Inst Phys & Appl Phys, Seoul 120749, South Korea
来源:
2009 34TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES, VOLS 1 AND 2
|
2009年
关键词:
TRANSISTORS;
D O I:
暂无
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
We have measured the terahertz transmittance of NiOx thin films grown on Si by thermal evaporation. The frequency-dependent conductivities were determined without resorting to a Kramers-Kronig analysis. Large changes in these spectral functions occurred due to varying deposition rate and annealing temperature. We observed a direct correlation between these parameters with the electronic and optical properties of NiOx thin films.
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页码:792 / 793
页数:2
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