Classification of imaging spectrometers for remote sensing applications

被引:143
作者
Sellar, RG
Boreman, GD
机构
[1] Univ Cent Florida, Dept Phys, Orlando, FL 32826 USA
[2] Univ Cent Florida, CREOL, Sch Opt, Orlando, FL 32816 USA
基金
美国国家航空航天局;
关键词
imaging spectrometry; imaging spectrometer; hyperspectral imaging; hyperspectral imagery; hyperspectral imager; remote sensing;
D O I
10.1117/1.1813441
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The continuing development of new and fundamentally different classes of imaging spectrometers has increased the complexity of the field of imaging spectrometry. The rapid pace at which new terminology is introduced to describe the new types of imaging spectrometers sometimes leads to confusion, particularly in discussions of the relative merits of the different types. In some cases, multiple different terms are commonly used to describe the same fundamental approach, and it is not always clear when these terms are synonymous. Other terminology in common use is overly broad. When a single term may encompass instruments that operate in fundamentally different ways, important distinctions may be obscured. In the interest of clarifying the terminology used in imaging spectrometry, we present a comprehensive system for classification of imaging spectrometers based on two fundamental properties: the method by which they scan the object spatially, and the method by which they obtain spectral information. (C) 2005 Society of PhotoOptical Instrumentation Engineers.
引用
收藏
页码:1 / 3
页数:3
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