Multifunctional Devices and Logic Gates With Undoped Silicon Nanowires

被引:94
作者
Mongillo, Massimo [1 ]
Spathis, Panayotis [1 ]
Katsaros, Georgios [1 ]
Gentile, Pascal [2 ]
De Franceschi, Silvano [1 ]
机构
[1] CEA INAC UJF Grenoble 1, SPSMS LaTEQS, F-38054 Grenoble 9, France
[2] CEA INAC UJF Grenoble 1, SP2M SINAPS, F-38054 Grenoble 9, France
关键词
Nanoelectronics; semiconductor nanowires; silicon transistors; Schottky barrier; logic gates; DOPANT DISTRIBUTION; TRANSISTORS; TECHNOLOGY; EMISSION; CONTACTS;
D O I
10.1021/nl300930m
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We report on the electronic transport properties of multiple-gate devices fabricated from undoped silicon nanowires. Understanding and control of the relevant transport mechanisms was achieved by means of local electrostatic gating and temperature-dependent measurements. The roles of the source/drain contacts and of the silicon channel could be independently evaluated and tuned. Wrap gates surrounding the silicide-silicon contact interfaces were proved to be effective in inducing a full suppression of the contact Schottky barriers, thereby enabling carrier injection down to liquid helium temperature. By independently tuning the effective Schottky barrier heights, a variety of reconfigurable device functionalities could be obtained. In particular, the same nanowire device could be configured to work as a Schottky barrier transistor, a Schottky diode, or a p-n diode with tunable polarities. This versatility was eventually exploited to realize a NAND logic gate with gain well above one.
引用
收藏
页码:3074 / 3079
页数:6
相关论文
共 32 条
[1]   Band-to-band tunneling in carbon nanotube field-effect transistors [J].
Appenzeller, J ;
Lin, YM ;
Knoch, J ;
Avouris, P .
PHYSICAL REVIEW LETTERS, 2004, 93 (19) :196805-1
[2]   Tunneling versus thermionic emission in one-dimensional semiconductors [J].
Appenzeller, J ;
Radosavljevic, M ;
Knoch, J ;
Avouris, P .
PHYSICAL REVIEW LETTERS, 2004, 92 (04) :4
[3]   Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETs [J].
Asenov, A ;
Brown, AR ;
Davies, JH ;
Kaya, S ;
Slavcheva, G .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2003, 50 (09) :1837-1852
[4]   Logic circuits with carbon nanotube transistors [J].
Bachtold, A ;
Hadley, P ;
Nakanishi, T ;
Dekker, C .
SCIENCE, 2001, 294 (5545) :1317-1320
[5]  
Björk MT, 2009, NAT NANOTECHNOL, V4, P103, DOI [10.1038/NNANO.2008.400, 10.1038/nnano.2008.400]
[6]   WORK FUNCTION AND BARRIER HEIGHTS OF TRANSITION-METAL SILICIDES [J].
BUCHER, E ;
SCHULZ, S ;
LUXSTEINER, MC ;
MUNZ, P ;
GUBLER, U ;
GREUTER, F .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1986, 40 (02) :71-77
[7]   Direct Measurements of Lateral Variations of Schottky Barrier Height Across "End-On" Metal Contacts to Vertical Si Nanowires by Ballistic Electron Emission Microscopy [J].
Cai, Wei ;
Che, Yulu ;
Pelz, Jonathan P. ;
Hemesath, Eric R. ;
Lauhon, Lincoln J. .
NANO LETTERS, 2012, 12 (02) :694-698
[8]   An integrated logic circuit assembled on a single carbon nanotube [J].
Chen, ZH ;
Appenzeller, J ;
Lin, YM ;
Sippel-Oakley, J ;
Rinzler, AG ;
Tang, JY ;
Wind, SJ ;
Solomon, PM ;
Avouris, P .
SCIENCE, 2006, 311 (5768) :1735-1735
[9]   Functional nanoscale electronic devices assembled using silicon nanowire building blocks [J].
Cui, Y ;
Lieber, CM .
SCIENCE, 2001, 291 (5505) :851-853
[10]   Carbon nanotube inter- and intramolecular logic gates [J].
Derycke, V ;
Martel, R ;
Appenzeller, J ;
Avouris, P .
NANO LETTERS, 2001, 1 (09) :453-456