A hysteresis-free perovskite transistor with exceptional stability through molecular cross-linking and amine-based surface passivation (Publication with Expression of Concern. See APR, 2025)

被引:47
作者
Kim, Hyeong Pil [1 ]
Vasilopoulou, Maria [2 ]
Ullah, Habib [3 ]
Bibi, Salma [3 ]
Gavim, Anderson Emanuel Ximim [4 ]
Macedo, Andreia Gerniski [4 ]
da Silva, Wilson Jose [4 ]
Schneider, Fabio Kurt [4 ]
Tahir, Asif Ali [3 ]
Teridi, Mohd Asri Mat [5 ]
Gao, Peng [6 ,7 ]
Yusoff, Abd Rashid Bin Mohd [8 ]
Nazeeruddin, Mohammad Khaja [9 ]
机构
[1] Kyung Hee Univ, Adv Display Res Ctr, Dept Informat Display, Seoul 130701, South Korea
[2] Natl Ctr Sci Res Demokritos, Inst Nanosci & Nanotechnol, Aghia Paraskevi 15341, Attica, Greece
[3] Univ Exeter, Environm & Sustainabil Inst, Pentyn Campus, Penryn TR10 9FE, Cornwall, England
[4] Univ Tecnol Fed Parana, Av Sete Setembro 3165, BR-80230901 Curitiba, Parana, Brazil
[5] Univ Kebangsaan Malaysia, Solar Energy Res Inst, Bangi 13600, Selangor, Malaysia
[6] Chinese Acad Sci, Fujian Inst Res Struct Matter, CAS Key Lab Design & Assembly Funct Nanostruct, Fuzhou 350002, Fujian, Peoples R China
[7] Chinese Acad Sci, Fujian Inst Res Struct Matter, Fujian Prov Key Lab Nanomat, Fuzhou 350002, Fujian, Peoples R China
[8] Swansea Univ, Dept Phys, Vivian Tower,Singleton Pk, Swansea SA2 8PP, W Glam, Wales
[9] Ecole Polytech Fed Lausanne, Inst Chem Sci & Engn, Rue Ind 17, CH-1951 Sion, Switzerland
关键词
FIELD-EFFECT TRANSISTORS; METAL-HALIDE PEROVSKITES; SOLAR-CELLS; PERFORMANCE; TRANSPORT; FILMS; MOBILITIES; EFFICIENCY; OXIDE;
D O I
10.1039/c9nr10745b
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Organo-metal halide perovskite field-effect transistors present serious challenges in terms of device stability and hysteresis in the current-voltage characteristics. Migration of ions located at grain boundaries and surface defects in the perovskite film are the main reasons for instability and hysteresis issues. Here, we introduce a perovskite grain molecular cross-linking approach combined with amine-based surface passivation to address these issues. Molecular cross-linking was achieved through hydrogen bond interactions between perovskite halogens and dangling bonds present at grain boundaries and a hydrophobic cross-linker, namely diethyl-(12-phosphonododecyl)phosphonate, added to the precursor solution. With our approach, we obtained smooth and compact perovskite layers composed of tightly bound grains hence significantly suppressing the generation and migration of ions. Moreover, we achieved efficient surface passivation of the perovskite films upon surface treatment with an amine-bearing polymer, namely polyethylenimine ethoxylated. With our synergistic grain and surface passivation approach, we were able to demonstrate the first perovskite transistor with a complete lack of hysteresis and unprecedented stability upon continuous operation under ambient conditions. Added to the merits are its ambipolar transport of opposite carriers with balanced hole and electron mobilities of 4.02 and 3.35 cm(2) V-1 s(-1), respectively, its high I-on/I-off ratio >10(4) and the lowest sub-threshold swing of 267 mV dec(-1) reported to date for any perovskite transistor. These remarkable achievements obtained through a cost-effective molecular cross-linking of grains combined with amine-based surface passivation of the perovskite films open a new era and pave the way for the practical application of perovskite transistors in low-cost electronic circuits.
引用
收藏
页码:7641 / 7650
页数:10
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