Approximation error method for imaging the human head by electrical impedance tomography*

被引:11
|
作者
Candiani, V [1 ]
Hyvonen, N. [1 ]
Kaipio, J. P. [2 ,3 ]
Kolehmainen, V [3 ]
机构
[1] Aalto Univ, Dept Math & Syst Anal, POB 11100, FI-00076 Aalto, Finland
[2] Univ Auckland, Dept Math, Private Bag 92019, Auckland 1142, New Zealand
[3] Univ Eastern Finland, Dept Appl Phys, Kuopio Campus,POB 1627, FI-70211 Kuopio, Finland
基金
芬兰科学院;
关键词
electrical impedance tomography; inverse boundary value problem; Bayesian inversion; approximation error method; lagged diffusivity; total variation; ARTIFICIAL BOUNDARY-CONDITIONS; INVERSE CONDUCTIVITY PROBLEM; OPTIMAL CURRENT PATTERNS; SPARSE LINEAR-EQUATIONS; DOMAIN TRUNCATION; ITERATIVE METHODS; ELECTRODE MODELS; IN-VIVO; RECONSTRUCTION; ALGORITHM;
D O I
10.1088/1361-6420/ac346a
中图分类号
O29 [应用数学];
学科分类号
070104 ;
摘要
This work considers electrical impedance tomography imaging of the human head, with the ultimate goal of locating and classifying a stroke in emergency care. One of the main difficulties in the envisioned application is that the electrode locations and the shape of the head are not precisely known, leading to significant imaging artifacts due to impedance tomography being sensitive to modeling errors. In this study, the natural variations in the geometry of the head and skull are modeled based on a library of head anatomies. The effect of these variations, as well as that of misplaced electrodes, on (absolute) impedance tomography measurements is in turn modeled by the approximation error method. This enables reliably reconstructing the conductivity perturbation caused by the stroke in an average head model, instead of the actual head, relative to its average conductivity levels. The functionality of a certain edge-preferring reconstruction algorithm for locating the stroke is demonstrated via numerical experiments based on simulated three-dimensional data.
引用
收藏
页数:24
相关论文
共 50 条
  • [1] BAYESIAN EXPERIMENTAL DESIGN FOR HEAD IMAGING BY ELECTRICAL IMPEDANCE TOMOGRAPHY
    Hyvonen, N.
    Jaaskelainen, A.
    Maity, R.
    Vavilov, A.
    SIAM JOURNAL ON APPLIED MATHEMATICS, 2024, 84 (04) : 1718 - 1741
  • [2] Discontinuous polynomial approximation in electrical impedance tomography with total variational regularization
    Jin, Bangti
    Xu, Yifeng
    Yang, Jingrong
    Zhang, Kai
    COMMUNICATIONS IN NONLINEAR SCIENCE AND NUMERICAL SIMULATION, 2024, 137
  • [3] Electrical impedance tomography spectroscopy (EITS) for human head imaging
    Yerworth, RJ
    Bayford, RH
    Brown, B
    Milnes, P
    Conway, M
    Holder, DS
    PHYSIOLOGICAL MEASUREMENT, 2003, 24 (02) : 477 - 489
  • [4] Robust imaging using electrical impedance tomography: review of current tools
    Brazey, Benoit
    Haddab, Yassine
    Zemiti, Nabil
    PROCEEDINGS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2022, 478 (2258):
  • [5] COMPUTATIONAL FRAMEWORK FOR APPLYING ELECTRICAL IMPEDANCE TOMOGRAPHY TO HEAD IMAGING
    Candiani, Valentina
    Hannukainen, Antti
    Hyvonen, Nuutti
    SIAM JOURNAL ON SCIENTIFIC COMPUTING, 2019, 41 (05) : B1034 - B1060
  • [6] An analysis of discontinuous Galerkin method for Electrical Impedance Tomography with partial data
    Li, Xiaosheng
    Wang, Wei
    JOURNAL OF COMPUTATIONAL AND APPLIED MATHEMATICS, 2025, 459
  • [7] An analysis of finite element approximation in electrical impedance tomography
    Gehre, Matthias
    Jin, Bangti
    Lu, Xiliang
    INVERSE PROBLEMS, 2014, 30 (04)
  • [8] The Bayesian approximation error approach for electrical impedance tomography - experimental results
    Nissinen, A.
    Heikkinen, L. M.
    Kaipio, J. P.
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2008, 19 (01)
  • [9] Anatomical Atlas of the Human Head for Electrical Impedance Tomography
    Ferreira, L. A.
    Beraldo, R. G.
    Camargo, E. D. L. B.
    Moura, F. S.
    XXVII BRAZILIAN CONGRESS ON BIOMEDICAL ENGINEERING, CBEB 2020, 2022, : 1693 - 1699
  • [10] A Regularization-Guided Deep Imaging Method for Electrical Impedance Tomography
    Fu, Rong
    Wang, Zichen
    Zhang, Xinyu
    Wang, Di
    Chen, Xiaoyan
    Wang, Huaxiang
    IEEE SENSORS JOURNAL, 2022, 22 (09) : 8760 - 8771