Rietveld refinement of ternary compound Gd117Fe52Ge112

被引：7

作者：

He, Wei ^{[1
]}

Zhang, Jiliang ^{[1
]}

Zeng, Lingmin ^{[1
]}

机构：

[1] Guangxi Univ, Dept Phys, Minist Educ, Key Lab Nonferrous Metal Mat & New Proc Technol, Nanning 530004, Peoples R China

来源：

POWDER DIFFRACTION | 2007年 / 22卷 / 04期

关键词：

Gd117Fe52Ge112; crystal structure; Rietveld method; X-ray diffraction data;

D O I：

10.1154/1.2793073

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A new ternary compound Gd117Fe52Ge112 has been successfully synthesized and studied by means of X-ray powder diffraction technique. Gd117Fe52Ge112 crystallizes in a cubic Tb117Fe52Ge112-type structure with space group Fm (3) over barm(#225) and lattice parameter a=28.7680(1) angstrom. Crystal structure of Gd117Fe52Ge112 has been successfully refined using the Rietveld method from X-ray diffraction data. The R-factors for the Rietveld refinement are R-p=0.099 and R-wp=0.128. X-ray powder diffraction data with the figure of merit F-30 of 80.4(30) are also reported. (C) 2007 International Centre for Diffraction Data.

引用

页码：312 / 315

页数：4

共 6 条

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