Coexistence of 2H and 4H polytypes in Zn1-xMgxSe observed by photo- and cathodoluminescence

被引：6

作者：

Firszt, F ^{[1
]}

Cichos, A

Dluzewski, P

Falke, U

Hietschold, M

Lenzner, J

Legowski, S

Meczynska, H

Paszkowicz, W

机构：

[1] Nicholas Copernicus Univ, Inst Phys, PL-87100 Torun, Poland

[2] Univ Technol, Inst Phys, D-09107 Chemnitz, Germany

[3] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland

[4] Univ Leipzig, Fac Phys, D-04103 Leipzig, Germany

来源：

SOLID STATE COMMUNICATIONS | 1998年 / 108卷 / 06期

关键词：

semiconductors; crystal growth; scanning and transmission electron microscopy; optical properties; luminescence;

D O I：

10.1016/S0038-1098(98)00366-4

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Zn1-xMgxSe mixed crystals grown from the melt, with a value of x close to 0.19 have been characterized by photoluminescence (PL) and cathodoluminescence (CL) methods. We have observed two emission lines at 3.025 eV and at 3.075 eV at 40 K in PL as well as in CL spectra instead of the usually seen only one exciton line. Applying spectrally resolved cathodoluminescence enabled us to interpret the two near-band-edge emission lines observed in PL and CL spectra as due to radiative recombination of free excitons in 4H and 2H polytype structures coexisting in the same sample. These results also demonstrate the analytical capabilities of the cathodoluminescence. (C) 1998 Elsevier Science Ltd. All rights reserved.

引用

页码：367 / 370

页数：4

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