A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model

被引:6
|
作者
Dang, Khanh N. [1 ]
Ahmed, Akram Ben [2 ]
Xuan-Tu Tran [3 ]
Okuyama, Yuichi [1 ]
Ben Abdallah, Abderazek [1 ]
机构
[1] Univ Aizu, Grad Sch Comp Sci & Engn, Adapt Syst Lab, Aizu Wakamatsu, Fukushima 9658580, Japan
[2] Keio Univ, Dept Informat & Comp Sci, Yokohama, Kanagawa 2238522, Japan
[3] VNU Univ Engn & Technol, Key Lab Smart Integrated Syst, Hanoi 123106, Vietnam
关键词
Analytical model; architecture and design; fault tolerance; reliability analysis; MANAGEMENT; TOLERANCE; ARCHITECTURE; CHALLENGES;
D O I
10.1109/TVLSI.2017.2736004
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The component's failure in network-on-chips (NoCs) has been a critical factor on the system's reliability. In order to alleviate the impact of faults, fault tolerance has been investigated in the recent years to enhance NoC's robustness. Due to the vast selection of fault-tolerance mechanisms and critical design constraints, selecting and configuring an appropriate mechanism to satisfy the fault-tolerance requirements constitute new challenges for designers. Consequently, reliability assessment has become prominent for the early stages of manufacturing process to solve these problems. This paper approaches the fault-tolerance analysis by providing an analytical model to approximate the lifetime reliability and compares it with a system-level simulation. Based on the proposed approach, we measure the fault-tolerance efficiency using a new parameter, named reliability acceleration factor. The goal of this paper is to provide an efficient and accurate reliability assessment to help designers easily understand and evaluate the advantages and drawbacks of their potential fault-tolerance methods.
引用
收藏
页码:3099 / 3112
页数:14
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