Low temperature sintering of Ca[(Li1/3Nb2/3)1-xTix]O3-δ based microwave dielectric ceramics with glass frit

被引:16
作者
Ha, JY [1 ]
Choi, JW
Kang, CY
Yoon, SJ
Cho, DJ
Kim, HJ
机构
[1] Korea Inst Sci & Technol, Thin Film Mat Res Ctr, Seoul 130650, South Korea
[2] Yonsei Univ, Dept Ceram Engn, Seoul 120749, South Korea
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2005年 / 44卷 / 03期
关键词
microwave; dielectric; LTCC; addition of glass;
D O I
10.1143/JJAP.44.1322
中图分类号
O59 [应用物理学];
学科分类号
摘要
The microstructures. and the microwave dielectric properties of Ca[(Li1/3Nb2/3)(1-x)Ti-x]O3-delta (CLNT) ceramics with different amount of glass frit additions were investigated. Addition of glass frit(B2O3-ZnO-SiO2-PbO system) improved the densification and decreased the sintering temperature from 1150 degrees C to 900 degrees C of Ca[(Li1/3Nb2/3)(1-x)Ti-x]O3-delta microwave dielectric ceramics. The dielectric constants (epsilon(r)) and bulk density were increased, as increasing glass contents from 10 wt% to 15 wt%. The quality factor (Q (.) f(0)), however, was decreased slightly. The temperature coefficients of the resonant frequency (tau(f)) shifted positive value as glass contents were increased. The dielectric proper-ties of Ca[(Li1/3Nb2/3)(0.8)Ti-0.2]O3-delta with 12 wt% glass sintered at 900 degrees C for 3 h were epsilon(r) = 40, Q (.) f(0) = 12, 500, tau(f) = -8ppm/degrees C, respectively. The relationship between the microstructure and dielectric properties of ceramics was studied by X-ray diffraction (XRD), energy dispersive spectroscopy (EDS) and scanning electron microscopy (SEM).
引用
收藏
页码:1322 / 1325
页数:4
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