Multiple fault detection in fan-out free circuits using minimal single fault test set

被引：8
作者：
Lai, K
Lala, PK
机构：
[1] Department of Electrical Engineering, North Carolina A and T State University, Greensboro
来源：
IEEE TRANSACTIONS ON COMPUTERS | 1996年 / 45卷 / 06期
关键词：
multiple faults; fan-out-free circuit; output count; test generation;
D O I：
10.1109/12.506433
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper presents a new algorithm to generate test sets for single stuck-at faults, which also detect all multiple stuck-at faults in fan-out-free circuits. This algorithm derives the test set for each node in a fan-out-free circuit by calculating the output count of the node. The output count indicates the number of test patterns needed to check for all faults in the corresponding subcircuit. The fan-out-free circuit can be any combination of AND, OR, NOT, NAND, and NOR gates.
引用
收藏
页码：763 / 765
页数：3
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