Simulated superior performances of semiconductor superjunction devices
被引:97
作者:
Fujihara, T
论文数: 0引用数: 0
h-index: 0
机构:
Fuji Elect Co Ltd, Matsumoto Factory, Matsumoto, Nagano 3900821, JapanFuji Elect Co Ltd, Matsumoto Factory, Matsumoto, Nagano 3900821, Japan
Fujihara, T
[1
]
Miyasaka, Y
论文数: 0引用数: 0
h-index: 0
机构:
Fuji Elect Co Ltd, Matsumoto Factory, Matsumoto, Nagano 3900821, JapanFuji Elect Co Ltd, Matsumoto Factory, Matsumoto, Nagano 3900821, Japan
Miyasaka, Y
[1
]
机构:
[1] Fuji Elect Co Ltd, Matsumoto Factory, Matsumoto, Nagano 3900821, Japan
来源:
ISPSD '98 - PROCEEDINGS OF THE 10TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS
|
1998年
关键词:
D O I:
10.1109/ISPSD.1998.702736
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Performances of majority- and minority-carrier semiconductor superjunction devices are examined and compared to that of standard devices in terms of forward current density, reverse leakage current, and switching charge. Based on two-dimensional simulations and theoretical calculations, it is shown that two orders of magnitude improvement in forward current density, an order of magnitude improvement in switching charge for majority-carrier superjunction devices, and an order of magnitude improvement in forward current density for minority-carrier superjunction devices are feasible when compared to standard devices.