Test of CZT detectors with different pixel pitches and thicknesses

被引：3
|
作者：
Li, Qiang [1 ]
Garson, Alfred I. I. I. [1 ]
Jung, Ira [1 ]
Groza, Michael [2 ]
Dowkontt, Paul [1 ]
Bose, Richard [1 ]
Simburger, Garry [1 ]
机构：
[1] Washington Univ, Dept Phys, 1 Brookings Dr,CB 1105, St Louis, MO 63130 USA
[2] Fisk Univ, Dept Phys, Nashville, TN 37208 USA
来源：
2007 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-11 | 2007年
关键词：
D O I：
10.1109/NSSMIC.2007.4436623
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The Modified Horizontal Bridgman (MHB) process produces Cadmium Zinc Telluride (CZT) crystals with high yield and excellent homogeneity. Various groups, including our own, previously reported on the test of 2x2x0.5 cm(3) MHB CZT detectors grown by the company Orbotech and read out with 8x8 pixels. In this contribution, we describe the optimization of the photolithographic process used for contacting the CZT detector with pixel contacts. The optimized process gives a high yield of good pixels down to pixel diameters/pitches of 50 microns. Furthermore, we discuss the performance of 0.5 cm and 0.75 cm thick detectors contacted with 64 and 225 pixel read out with the RENA-3 ASICs from the company NOVA R&D.
引用
收藏
页码：2381 / +
页数：2
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