Production of Nitrogen-Doped Graphene by Low-Energy Nitrogen Implantation

被引:97
作者
Zhao, W. [1 ]
Hoefert, O. [1 ]
Gotterbarm, K. [1 ]
Zhu, J. F. [2 ]
Papp, C. [1 ]
Steinrueck, H. -P. [1 ,3 ,4 ]
机构
[1] Univ Erlangen Nurnberg, Lehrstuhl Phys Chem 2, D-91058 Erlangen, Germany
[2] Univ Sci & Technol China, Natl Synchrotron Radiat Lab, Hefei 230029, Peoples R China
[3] Univ Erlangen Nurnberg, Interdisciplinary Ctr Interface Controlled Proc, D-91058 Erlangen, Germany
[4] Univ Erlangen Nurnberg, Erlangen Catalysis Resource Ctr, D-91058 Erlangen, Germany
基金
中国国家自然科学基金;
关键词
MONOLAYER GRAPHENE; NI(111); NO; SPECTROSCOPY; SURFACE; FILMS; BORON;
D O I
10.1021/jp209927m
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Nitrogen doping of graphene is a suitable route to tune the electronic structure of graphene, leading to n-type conductive materials. Herein, we report a simple way to insert nitrogen atoms into graphene by low-energy nitrogen bombardment, forming nitrogen-doped graphene. The formation of nitrogen-doped graphene is investigated with high resolution X-ray photoelectron spectroscopy, allowing to determine the doping level and to identify two different carbon nitrogen species. By application of different ion implantation energies and times, we demonstrate that a doping level of up to 0.05 monolayers is achievable and that the branching ratio of the two nitrogen species can be varied.
引用
收藏
页码:5062 / 5066
页数:5
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