共 13 条
- [2] HAYASHI F, 1992, S VLSI, P36
- [3] Ikeda S., 1993, International Electron Devices Meeting 1993. Technical Digest (Cat. No.93CH3361-3), P809, DOI 10.1109/IEDM.1993.347276
- [4] Itabashi K., 1991, International Electron Devices Meeting 1991. Technical Digest (Cat. No.91CH3075-9), P477, DOI 10.1109/IEDM.1991.235352
- [5] ITOH K, 1991, 1991 INT C SOL STAT, P468
- [6] KURIYAMA H, 1992, S VLSI TECHN DIG TEC, P38
- [7] A 0.4 MU-M GATE-ALL-AROUND TFT (GAT) USING A DUMMY NITRIDE PATTERN FOR HIGH-DENSITY MEMORIES [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1995, 34 (2B): : 895 - 899
- [8] Ohkubo H., 1991, International Electron Devices Meeting 1991. Technical Digest (Cat. No.91CH3075-9), P481, DOI 10.1109/IEDM.1991.235351
- [10] STATIC-NOISE MARGIN ANALYSIS OF MOS SRAM CELLS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1987, 22 (05) : 748 - 754