Statistical compact modeling of variations in nano MOSFETs

被引：11

作者：

Lin, Chung-Hsun ^{[1
]}

Dunga, Mohan V. ^{[1
]}

Lu, Darsen ^{[1
]}

Niknejad, Ali M. ^{[1
]}

Hu, Chenming ^{[1
]}

机构：

[1] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA

来源：

2008 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATIONS (VLSI-TSA), PROCEEDINGS OF TECHNICAL PROGRAM | 2008年

关键词：

D O I：

10.1109/VTSA.2008.4530849

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：165 / 166

页数：2

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