Role of the charge state of deep vanadium impurities and associations of defects in photoelectric and optical properties of semi-insulating CdTe

被引:26
作者
Jarasiunas, K
Bastiene, L
Launay, JC
Delaye, P
Roosen, G
机构
[1] Vilnius State Univ, Inst Mat Sci & Appl Res, LT-2040 Vilnius, Lithuania
[2] Act Aquitaine Rech Apesanteur, F-33165 St Medard Jalles, France
[3] Ctr Sci Orsay, Inst Opt, Lab Charles Fabry, CNRS, F-91403 Orsay, France
关键词
D O I
10.1088/0268-1242/14/1/006
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Photoexcited carrier and space charge field subnanosecond dynamics has been investigated in bulk vanadium-doped and Cl- (or As-) co-doped CdTe crystals by using a degenerate four-wave mixing technique. Time-resolved measurements of picosecond grating decay at various illumination intensities revealed peculiarities of defect transformation with doping or under illumination. Novel features in carrier generation and dynamics were observed for the first time and allowed parameters of the defects to be extracted. A fast electron capture and its saturation with increasing intensity of illumination were observed in CdTe:V and attributed to a Cd divacancy, which is known as a deep double acceptor. Numerical modelling by using the two-deep-trap model allowed us to extract the concentration and recombination activity of Cd divacancies. An enhanced electron generation rate by factor of 3-4 was found in Cl-co-dopcd CdTe:V crystals in spite of a decreased density of donor vanadium states after the co-doping. We attribute this additional channel of electron generation to photoexcitation of the DX centre, which activation energy of 1-1.2 eV is close to a quantum energy of the YAG:Nd laser used (h nu = 1.17 eV).
引用
收藏
页码:48 / 57
页数:10
相关论文
共 25 条
[1]  
AGRINSKAYA NV, 1990, SOV PHYS SEMICOND+, V24, P437
[2]  
AGRINSKAYA NV, 1994, SEMICONDUCTORS+, V28, P843
[3]  
Bourgoin JC, 1997, J PHYS III, V7, P2145, DOI 10.1051/jp3:1997246
[4]   CHARACTERIZATION AND IDENTIFICATION OF THE DEEP LEVELS IN V DOPED CDTE AND THEIR RELATIONSHIP WITH THE PHOTOREFRACTIVE PROPERTIES [J].
BREMOND, G ;
ZERRAI, A ;
MARRAKCHI, G ;
AOUDIA, A ;
MARFAING, Y ;
TRIBOULET, R ;
BUSCH, MC ;
KOEBBEL, JM ;
HAGEALI, M ;
SIFFERT, P ;
MOISAN, JY .
OPTICAL MATERIALS, 1995, 4 (2-3) :246-251
[5]   Deep energy levels in CdTe and CdZnTe [J].
Castaldini, A ;
Cavallini, A ;
Fraboni, B ;
Fernandez, P ;
Piqueras, J .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (04) :2121-2126
[6]  
DELAYE P, 1993, J PHYS III, V3, P1291, DOI 10.1051/jp3:1993199
[7]   Wavelength dependent effective trap density in CdTe: Evidence for the presence of two photorefractive species [J].
Delaye, P ;
deMontmorillon, LA ;
Biaggio, I ;
Launay, JC ;
Roosen, G .
OPTICS COMMUNICATIONS, 1997, 134 (1-6) :580-590
[8]  
DELAYE P, 1993, P SOC PHOTO-OPT INS, V2097, P474
[9]   Correlations between microscopic properties and the photorefractive response for vanadium-doped CdTe [J].
deMontmorillon, LA ;
Delaye, P ;
Roosen, G ;
Rjeily, HB ;
Ramaz, F ;
Briat, B ;
Gies, JG ;
Zielinger, JP ;
Tapiero, M .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1996, 13 (10) :2341-2351
[10]   COMPARATIVE-STUDY OF CDTE AND GAAS PHOTOREFRACTIVE PERFORMANCES FROM 1 MU-M TO 1.55 MU-M [J].
DEMONTMORILLON, LA ;
DELAYE, P ;
LAUNAY, JC ;
ROOSEN, G .
OPTICAL MATERIALS, 1995, 4 (2-3) :233-236