Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements

被引：45

作者：

Cardin, Julien ^{[1
]}

Leduc, Dominique ^{[2
]}

机构：

[1] ENSICEAN, CNRS, SIFCOM, UMR 6176, F-14050 Caen, France

[2] Univ Nantes, Nantes Atlantique Univ, IREENA, EA1770,Fac Sci & Techn, F-44000 Nantes, France

来源：

APPLIED OPTICS | 2008年 / 47卷 / 07期

关键词：

D O I：

10.1364/AO.47.000894

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a method of analysis of prism-film coupler spectroscopy based on the use of transfer matrix and genetic algorithm, which allows the simultaneous determination of refractive index, thickness, and optical losses of the measured layer. (C) 2008 Optical Society of America.

引用

页码：894 / 900

页数：7

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