Study of transition kinetics of Se80Te20-xInx chalcogenide glasses

Chalcogenide glasses with the chemical formula Se80Te20-xInx (x = 5, 10 and 15) were prepared using the melt quenching method. The amorphous nature of the prepared samples was checked by X-ray diffraction analysis. The thermal behavior was investigated by using differential scanning calorimetry at different heating rates, 5, 10, 15 and 20 degrees C/min. Lasocka relation was used to study the heating rate dependence of the glass and crystallization temperatures. Kissinger and Mahadevan models were used to determine the glass and crystallization activation energies. The time dependence of the ac conductivity at 1 kHz performed at different annealing temperatures, 75, 80, 85 and 90 degrees C, was used to calculate Avrami exponent. The frequency factor was determined from the temperature dependence of the rate constant.